TEi Metallurgical Laboratory invests in new Scanning Electron Microscope (SEM) for failure analyses

Hitachi Model S-3400N Variable Pressure Scanning Electron Microscope fitted with Oxford Instruments X-Max Energy Dispersive X-ray (EDX) analyser.

The S-3400N has a secondary electron (SE) detector, back scattered electron (BSE) detector and environmental SE detector. The SE detector is typically used to examine fracture surfaces of metals. The BSE detector gives image contrast between distinct phases or substances and so is particularly useful in the identification of microstructural features or contaminants for example. The environmental detector is used to examine oily or non-conductive samples such as corrosion products, without the need for conventional sample preparation.

The EDX system can establish the elemental composition of materials, deposits, particles, corrosion products, coatings, and other similar substances. Analysis can be undertaken on isolated spots or as a nano-scale resolution map of the distribution of elements in an area. The EDX system is used to examine fractures surfaces and prepared samples.